ATE Test Solutions

Delivering outstanding ATE device programs and optimized solutions with our result driven process from device planning to RTP.

Platforms

Advantest V93K
Teradyne Eagle
Teradyne J750
Teradyne Flex
VLCT
Various Legacy Platforms

Services

Legacy Conversions
New Devices
Test Improvement
Test Time Reduction
Qual Analysis

Product Areas

High-Speed Digital
Mixed signal
Complex SoC
RF
ADCs, DACs
Power
Logic
Switches
Sense-amps
DSPs
Microcontrollers

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Our Process

Planning

  • Meet with designers and gather requirements
  • Review data sheet and product understanding
  • Prepare test and validation requirements
  • Tester platform selection for optimization
  • Test plan development

ATE development

  • HIB/DIB (Load board) design
  • Test program development
  • Device and test program debug
  • DFT/BIST
  • Functional vector generation and verification
  • Scan/Pattern conversion
  • Characterization
  • Correlation
  • Bin to bin
  • Qualification
  • Reliability and Repeatability
  • Release to production

Post-Release Support

  • Test time reduction
  • Test program optimization
  • Yield improvements
  • Test program stability
  • Qual analysis

We can provide you a turn-key ATE device test solution

We know device test inside and out.

Contact us